Texas A&M · Electrical & Comp Engr
ECEN 680 Testing and Diagnosis of Digital Systems
- Catalog credits
- 3
- Spring 2027 sections
- None listed
- Historical grades
- 1 section record
Grade history by instructor
Choose a term to see published sections. Bars show each letter’s share of the A–F grades in that row.
Reports checked for 12 terms from Spring 2021 through Summer 2026. The registrar suppresses small sections. Campus is unspecified in these college reports.
Spring 2023 · 1 section record
| Instructor and section | A–F grades | GPA | Source |
|---|---|---|---|
| SHI WSection 600 · Engineering | A 18B 7C 0D 0F 0 25 A–F | 3.720 | PDF p. 109 |
Catalog and requirements
2026–2027 · Graduate and professional · Catalog excerpt
The theory and techniques of testing VLSI-based circuits and systems, and design for testability.
Catalog references include ECEN 248, ECEN 350, CSCE 350. Check the official entry for the full conditions.
Cross-listed as · CSCE 680
Catalog checked Full official catalog entry
College Station sections
Use the Howdy schedule to confirm seats, restrictions and registration.
- Spring 2027 · No College Station sections in this snapshot.
- Fall 2026 · No College Station sections in this snapshot.
- Summer 2026 · No College Station sections in this snapshot.
- Spring 2026 · No College Station sections in this snapshot.
- Fall 2025 · No College Station sections in this snapshot.
Sources checked Open Howdy Public Class Search